ACCELERATED RELIABILITY TEST TECHNIQUES USED TO FIND DEFECTS WITHIN PRINTED CIRCUIT BOARDS - (.pdf 0.2mb)

WHY HALT CANNOT PRODUCE A MEANINGFUL MTBF NUMBER AND WHY THIS SHOULD NOT BE A CONCERN - (.pdf 0.05mb)

HASS DEVELOPMENT METHODOLOGY: HOW TO DEVELOP A SCREEN, WHEN TO CHANGE A SCREEN, AND WHEN TO RE-PROVE A SCREEN - (.pdf 0.05mb)

SUMMARY OF HALT AND HASS RESULTS AT AN ACCELERATED RELIABILITY TEST CENTER - (.pdf 0.08mb)

THERMAL AND VIBRATION ISOLATION TECHNIQUESFOR HARD DRIVES AND PCI CARDS - (.pdf 0.17mb)

PRE-HALT ANALYSIS IS ESSENTIAL FOR A SUCCESSFUL HALT - (.pdf 0.06mb)

HALT AND HASS ON THE VOICEMEMO II™ - (.pdf 0.04mb)