Physics of Failure

by Mr. Abhijit Dasgupta, Ph.D.

This course offers an introductory understanding of some of the key accelerated test techniques needed to develop reliable electronic products. Participants are presented with various physics of failure methods to provide design and test for reliability. Learn how products really fail and understand key reliability issues. Become acquainted with the failure modes and mechanisms associated with various electronic devices and assemblies. Determine the stresses associated with the assessment of reliable electronic equipment and examine techniques to address problems of reliability. Investigate the usage and applicability of reliability standards and handbooks. The content of this course is complementary to the HALT and HASS seminars.

WHO SHOULD ATTEND

This course is intended for those who are involved in the design, analysis, material selection, manufacture and test of microelectronic components, printed circuit/wiring boards and assemblies. Participants will receive an understanding of the various reliability tradeoffs in electronic packaging.

Click here for a complete, printable, class description.
CLASSES ON RELIABILITY QUICK REGISTRATION
Length Course Number and Title Instructor
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Payment at Seminar
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Seminars fees for North America:
1 day - $695; 2 days - $1195; 4 days - $1695
Click here for Standard Registration Form
2 days Practical Reliability Engineering Chet Haibel, M.S.E.E.
2 days HALT & HASS + Workshop Gregg Hobbs, Ph.D., P.E.
2 days Demonstrating Reliability with Accel. Testing Larry Edson, BSME, CQE
1 day Advanced Applications in Accelerated Testing Larry Edson, BSME, CQE
4 days Accelerated Test Data Analysis Wayne Nelson, Ph.D.
SPECIFIC TECHNICAL CLASSES
2 days Physics of Failure Mr. Abhijit Dasgupta, Ph.D.
2 days Lead-Free Solder Joint Reliability Jean-Paul Clech, Ph.D.
2 days Preventing Vibration & Shock Failures Prof. Dave Steinberg, P.E.
2 days Preventing Thermal Cycling & Vibr. Failures Prof. Dave Steinberg, P.E.
2 days Cooling Techniques for Electronic Equip. Prof. Dave Steinberg, P.E.
CUSTOM SEMINARS OFFERED
1 day Integrating Adv. Quality, Reliability, Durability
(QRD) Tactics with Accelerated Product Dev.		 James G. McLeish, M.S.
3 days HALT & HASS and Classical Rel. Methods Integrated Hobbs / Haibel