
Accelerated Test Data Analysis
by Mr. Wayne Nelson, Ph.D.
Accelerated testing quickly yields information on the reliability of products by exposing them to higher than normal stresses and then fitting engineering models to the data to obtain estimates of product reliability under normal conditions. Such testing applies to electronics including microprocessors, semiconductors, solid state devices, conductors, encapsulants, connections and capacitors. It also applies to metals, insulation materials, ceramics, plastics, composites, pharmaceuticals, food, paints, rubber and chemicals.
WHO SHOULD ATTEND
This Accelerated Test Data Analysis course on engineering and statistical models and data analysis methods will benefit engineers, statisticians, and others working in development, reliability, testing, manufacturing, procurement, and data analysis. You will learn how to use engineering and statistical models for accelerated tests, how to plan efficient tests, and how to estimate and improve product reliability.
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