DR. WAYNE NELSON

Dr. Wayne Nelson is a leading expert on analysis of reliability and accelerated test data.  He consults and gives training courses for companies andprofessional societies.   For 24 years he consulted across the General Electric Co. and received the Dushman Award of GE Corp. R&D for developments and applications of product reliability data analysis.  He was elected a Fellow ofthe Amer. Statistical Assoc. (1973), the Amer. Soc. for Quality (1983), the Institute of Electrical and Electronics Engineers (1988) for his innovative developments.  He was awarded the 2003 Shewhart Medal and the 2010 Shainin Medal of ASQ and the 2005 Lifetime Achievement Award of IEEE for outstanding developments of methodology and contributions to reliability education.  He authored three highly regarded books Applied Life Data Analysis (Wiley 1982, 2004), Accelerated Testing (Wiley 1990, 2004), Recurrent Events Data Analysis for Repairs (SIAM 2003), two ASQ booklets, and 130 journal articles.
NEW SEMINARS
Length Course Title Instructor
1 day 17. Ensuring Reliability in Lean Product Development John Paschkewitz
1 day 18. Advancing HALT & HASS:
Moving to Comparative Limit Anaylsis		 Kirk Gray
3 hours 19. How to Effectively Implement DFR & DFSS
in a Systems Engineering Environment		 Thimmiah Gurunatha, Peng.
3 hours 20. Thunder & Lightning Accelerated Testing
in a Systems Engineering Environment		 Thimmiah Gurunatha, Peng.
3 hours Gage R & R or Measuring Systems Analysis Thimmiah Gurunatha, Peng.
3 hours Rainbow SPC Thimmiah Gurunatha, Peng.
3 hours Improving Test Effect. and Effic. using Orthogonal Arrays Thimmiah Gurunatha, Peng.
3 hours Design for Six Sigma Tools to Promote the Development of World Class Product Requirements Sam Keene
3 hours 21. Quickest Way to Reliability is to
HALT and go FISHing		 Howard Cooper, DFSS BB, DFR
2 hours 22. Understanding Shock and Vibration Alec Feinberg, Ph.D.
3 hours Physics of Failure Methods for Building-in Reliability into Products Abhijit Dasgupta, Ph.D.
3 hours 24. Intro to Design for Manufacturability Aldo Fucinari
3 hours 25. Microelectronic Pkg Issues and Failure Analysis Tom Green
CLASSES ON RELIABILITY
Length Course Title Instructor
2 days 1. Introduction to Reliability & Weibull Analysis Chet Haibel, M.S.E.E.
2 days 2. HALT & HASS + Workshop Kirk Gray
2 days 2. HALT & HASS + Workshop Chet Haibel
2 days 2a. Mastering HALT & HASS Kirk Gray
2 days 2a. Mastering HALT & HASS Chet Haibel
2 days 4. Demonstrating Reliability Chet Haibel
4 days 6. Accelerated Test Data Analysis Wayne Nelson, Ph.D.
SPECIFIC TECHNICAL CLASSES
Length Course Title Instructor
2 days 7. Physics of Failure Abhijit Dasgupta, Ph.D.
2 days 8. Lead-Free Solder Joint Reliability Jean-Paul Clech, Ph.D.
1 day 9. Medical Device Risk Management Chet Haibel, M.S.E.E.
2 days 14. Cooling Techniques for Electronic Equipment Steve Carlson
2 days 15. Preventing Shock and Vibration Failures Steve Carlson
2 days 16. Preventing Thermal & Vibration Failures Steve Carlson
CUSTOM SEMINARS OFFERED
Length Course Title Instructor
1 day 12. Integrating Adv. Quality, Reliability, Durability
(QRD) Tactics with Accelerated Product Dev.		 James G. McLeish, M.S.
3 days 13. HALT & HASS and Classical Rel. Methods Integrated Chet Haibel, M.S.E.E.


Click here for a summary of his class, Accelerated Test Data Analysis

Published Papers

Review by THE JOURNAL OF QUALITY TECHNOLOGY
CLASS REGISTRATION
Check Mailed
Payment at Seminar
Visa or Mastercard
(for your security, please fax or phone your credit card information after registering)

Seminars fees for North America:
1 day - $695;
2 days - $1195; 3 days - $1595.
Please contact Hobbs Engineering for Webinar pricing.
Click here for the long Registration Form
Contacts:
Hobbs Engineering Corp.
4300 West 100th Ave,
Westminster, CO 80031
Tel: 303-465-5988
Fax: 303-469-4353
learn@hobbsengr.com

©2011 Hobbs Engineering Corp.