Wayne Nelson, Ph.D.

Dr. Wayne Nelson is a leading expert on reliability and accelerated test data analysis. Formerly with General Electric Research & Development for 23 years, he now consults on and teaches engineering applications of Statistics for many companies, professional societies, and universities. For his contributions to reliability data analysis and accelerated testing, he was elected a Fellow of the Inst. of Electrical and Electronics Engineers, the Amer. Soc. for Quality, and the Amer. Statistical Assoc. He authored two other well-known Wiley books "ACCELERATED TESTING" and "APPLIED LIFE DATA ANALYSIS". Among his 120+ publications, he received the Brumbaugh, Wilcoxon, and Youden Prizes of ASQ and eight outstanding presentation awards from ASA. For technical questions, he can be reached at 739 Huntingdon Dr., Schenectady, NY 12309, (518) 346-5138.

Click here for a summary of his class, Accelerated Test Data Analysis

Published Papers
CLASSES ON RELIABILITY QUICK REGISTRATION
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Seminars fees for North America:
1 day - $695; 2 days - $1195; 4 days - $1695
Click here for Standard Registration Form
2 days Practical Reliability Engineering Chet Haibel, M.S.E.E.
2 days HALT & HASS + Workshop Gregg Hobbs, Ph.D., P.E.
2 days Demonstrating Reliability with Accel. Testing Larry Edson, BSME, CQE
1 day Advanced Applications in Accelerated Testing Larry Edson, BSME, CQE
4 days Accelerated Test Data Analysis Wayne Nelson, Ph.D.
SPECIFIC TECHNICAL CLASSES
2 days Physics of Failure Mr. Abhijit Dasgupta, Ph.D.
2 days Lead-Free Solder Joint Reliability Jean-Paul Clech, Ph.D.
2 days Preventing Vibration & Shock Failures Prof. Dave Steinberg, P.E.
2 days Preventing Thermal Cycling & Vibr. Failures Prof. Dave Steinberg, P.E.
2 days Cooling Techniques for Electronic Equip. Prof. Dave Steinberg, P.E.
CUSTOM SEMINARS OFFERED
1 day Integrating Adv. Quality, Reliability, Durability
(QRD) Tactics with Accelerated Product Dev.		 James G. McLeish, M.S.
3 days HALT & HASS and Classical Rel. Methods Integrated Hobbs / Haibel