Fred Khorasani, Ph.D.

Dr. Fred Khorasani is a management consultant and industrial statistician. He received his Ph.D. in Statistics from Kansas State University. His academic experience includes associate professor of statistics, Head of the Statistics Department and Associate Dean of the School of Mathematics and Computer Science. For nine years he worked in California for Fairchild Semiconductor, Signetics and Intel Corporations. Since 1988 he has had his own practice consulting and teaching in semiconductor industry in companies such as VLSI* Technology, Altera Corporation, Cypress, Elontec, Weitek, Sierra Semi-conductor, Samsung, Applied Materials and Sandia National Laboratories, EKC Technology, Unigen and Hewlett-Packard.

He has published articles on statistics theory and application in the American Statistical Association Journal and Communications in Statistics and has given numerous seminars and presentations on application of statistics in the semiconductor industry, quality and productivity philosophies to local and national meetings of IEEE, SPIE, QIE, ASQC, ASA, and SEMICON WEST. His paper entitled "The Changing Philosophy of Quality and Productivity from Basic Inspection to Taguchi's Ideas of Robustness" was selected the best technical supplement paper of 1990 by The Electronics Division of the American Society for Quality.

His professional activities include refereeing for Technometrics, the Journal of the American Electrochemical Society, and SPC book proposal review for a publishing company. He is also the past chairman of the ASQC Bay Area Statistics Group and has been an active participant of the ASQC and ASA Bay Area and San Francisco chapters.

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OPEN SEMINAR SCHEDULE QUICK REGISTRATION
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Seminars fees for North America:
1/2 Day - $399; Workshop - $495; 1/2 day - $450;
1 day - $695; 2 days - $1195; 4 days - $1695
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2 days 1. Comprehensive HALT & HASS Gregg Hobbs, Ph.D., P.E.
1 day 2. HALT & HASS Workshop Gregg Hobbs, Ph.D., P.E.
4 days 3. Accelerated Test Data Analysis Wayne Nelson, Ph.D.
2 days 4. Demonstrating Reliability with Accel. Testing Larry Edson, BSME, CQE
2 days 5. Practical Reliability Engineering Chet Haibel, M.S.E.E.
2 days 6. Physics of Failure Mr. Abhijit Dasgupta, Ph.D.
4 days 7. Practical D.O.E. Strategies Fred Khorasani, Ph.D.
2 days 8. Design for Reliability Fred Schenkelberg, M.S.
2 days 9. Lead-Free Solder Joint Reliability Jean-Paul Clech, Ph.D.
2 days 10. Software Reliability Kishor S. Trivedi, Ph.D.
1/2 day 11. Designing for Warranty Cost Reduction Robert Mueller, M.S.
2 days 12. Cooling Techniques for Electronic Equip. Prof. Dave Steinberg, P.E.
2 days 13. Preventing Vibration & Shock Failures Prof. Dave Steinberg, P.E.
2 days 14. Preventing Thermal Cycling & Vibr. Failures Prof. Dave Steinberg, P.E.
1 day 15. Developing a Reliability Program Plan Larry Edson, BSME, CQE
2 days 16. Principles & Practice of Shock & Vibr. Testing Mr. George Hieber, P.E.
2 days 17. Essential Reliability Tools Mike Silverman, C.R.E.
3 days 18. HALT&HASS and Class. Rel. Methods Integrated
Offered as an In-House Seminar only
Gregg Hobbs &
Mike Silverman, C.R.E.
1 day 19. Integrating Adv. Quality, Reliability, Durability
(QRD) Tactics with Accelerated Product Dev.
James G. McLeish, M.S.
2 days 20. Reliability Incorporating HALT & HASS Bob Page / Martin Shaw