ACCELERATED TEST DATA ANALYSIS

by Mr. Wayne Nelson, Ph.D.

Accelerated testing quickly yields information on the reliability of products by exposing them to higher than normal stresses and then fitting engineering models to the data to obtain estimates of product reliability under normal conditions. Such testing applies to electronics including microprocessors, semiconductors, solid state devices, conductors, encapsulants, connections and capacitors. It also applies to metals, insulation materials, ceramics, plastics, composites, pharmaceuticals, food, paints, rubber and chemicals.

WHO SHOULD ATTEND

This Accelerated Test Data Analysis course on engineering and statistical models and data analysis methods will benefit engineers, statisticians, and others working in development, reliability, testing, manufacturing, procurement, and data analysis. You will learn how to use engineering and statistical models for accelerated tests, how to plan efficient tests, and how to estimate and improve product reliability.

The fee for this 4-day Seminar is $1695.

Click here for a complete, printable, class description
NEW SEMINARS AND WEBINARS
Length Course Title Instructor
1 day 17. Ensuring Reliability in Lean Product Development John Paschkewitz
1 day 18. Advancing HALT & HASS:
Moving to Comparative Limit Anaylsis		 Kirk Gray
3 hours 19. How to Effectively Implement DFR & DFSS
in a Systems Engineering Environment		 Thimmiah Gurunatha, Peng.
3 hours 20. Thunder & Lightning Accelerated Testing
in a Systems Engineering Environment		 Thimmiah Gurunatha, Peng.
3 hours Gage R & R or Measuring Systems Analysis Thimmiah Gurunatha, Peng.
3 hours Rainbow SPC Thimmiah Gurunatha, Peng.
3 hours Improving Test Effect. and Effic. using Orthogonal Arrays Thimmiah Gurunatha, Peng.
3 hours Design for Six Sigma Tools to Promote the Development of World Class Product Requirements Sam Keene
3 hours 21. Quickest Way to Reliability is to
HALT and go FISHing		 Howard Cooper, DFSS BB, DFR
2 hours 22. Understanding Shock and Vibration Alec Feinberg, Ph.D.
3 hours Physics of Failure Methods for Building-in Reliability into Products Abhijit Dasgupta, Ph.D.
3 hours 24. Intro to Design for Manufacturability Aldo Fucinari
3 hours 25. Microelectronic Pkg Issues and Failure Analysis Tom Green
CLASSES ON RELIABILITY
Length Course Title Instructor
2 days 1. Introduction to Reliability & Weibull Analysis Chet Haibel, M.S.E.E.
2 days 2. HALT & HASS + Workshop Kirk Gray
2 days 2. HALT & HASS + Workshop Chet Haibel
2 days 2a. Mastering HALT & HASS Kirk Gray
2 days 2a. Mastering HALT & HASS Chet Haibel
2 days 4. Demonstrating Reliability Chet Haibel
4 days 6. Accelerated Test Data Analysis Wayne Nelson, Ph.D.
SPECIFIC TECHNICAL CLASSES
Length Course Title Instructor
2 days 7. Physics of Failure Abhijit Dasgupta, Ph.D.
2 days 8. Lead-Free Solder Joint Reliability Jean-Paul Clech, Ph.D.
1 day 9. Medical Device Risk Management Chet Haibel, M.S.E.E.
2 days 14. Cooling Techniques for Electronic Equipment Steve Carlson
2 days 15. Preventing Shock and Vibration Failures Steve Carlson
2 days 16. Preventing Thermal & Vibration Failures Steve Carlson
CUSTOM SEMINARS OFFERED
Length Course Title Instructor
1 day 12. Integrating Adv. Quality, Reliability, Durability
(QRD) Tactics with Accelerated Product Dev.		 James G. McLeish, M.S.
3 days 13. HALT & HASS and Classical Rel. Methods Integrated Chet Haibel, M.S.E.E.

CLASS REGISTRATION
Check Mailed
Payment at Seminar
Visa or Mastercard
(for your security, please fax or phone your credit card information after registering)

Seminars fees for North America:
1 day - $695;
2 days - $1195; 3 days - $1595.
Please contact Hobbs Engineering for Webinar pricing.
Click here for the long Registration Form
Contacts:
Hobbs Engineering Corp.
4300 West 100th Ave,
Westminster, CO 80031
Tel: 303-465-5988
Fax: 303-469-4353
learn@hobbsengr.com

©2011 Hobbs Engineering Corp.